X-ray stress measurement by use of synchrotron radiation source.
نویسندگان
چکیده
منابع مشابه
X-ray synchrotron radiation and particle acceleration
I discuss X-ray synchrotron emission as a probe of particle acceleration, concentrating mainly on low-power (FRI) jets but also touching on the hotspots in FRII sources. Combining X-ray and radio data has allowed us to locate the sites of high-energy particle acceleration, and hence jet kinetic energy dissipation, in a number of objects. Recent data solve some old problems but present some new ...
متن کاملHigh Resolution X-ray Imaging by Portable Synchrotron Radiation Source "mirrorcle-6x"
MIRRORCLE-6X is a portable synchrotron composed of a 6-MeV microtron injector, and a 60cm outer diameter exactly circular synchrotron ring made of a normal conducting magnet. The injection is performed at 400 Hz repetitions by 100 mA injector peaks current, which lead to 3A accumulated peak current. X-rays are generated by a collision of the relativistic electron beam and a small target placed ...
متن کاملExperimental measurement of the effect of copper through-silicon via diameter on stress buildup using synchrotron-based X-ray source
In this work, the effect of copper through-silicon via (TSV) interconnect diameter on stress buildup in Cu TSVs was experimentally determined using a synchrotron-based X-ray microdiffraction technique. A single chip with different Cu TSV diameters (3, 5, and 8 lm), all having the same depth and processing conditions was studied. Prior to the measurements, the chip was annealed at 420 C (30 min)...
متن کاملMeasurement of the x-ray mass attenuation coefficient of copper using 8.85–20 keV synchrotron radiation
This work presents the x-ray extended range technique for measuring x-ray mass attenuation coefficients. This technique includes the use of multiple foil attenuators at each energy investigated, allowing independent tests of detector linearity and of the harmonic contributions to the monochromated synchrotron beam. Measurements over a wide energy range allow the uncertainty of local foil thickn...
متن کاملScanning Tunneling Microscopy Combined with Hard X-ray Microbeam of High Brilliance from Synchrotron Radiation Source
Akira SAITO, Junpei MARUYAMA, Ken MANABE, Katsuyuki KITAMOTO, Koji TAKAHASHI, Kazuhiro TAKAMI, Shinji HIROTSUNE, Yasumasa TAKAGI, Yoshihito TANAKA, Daigo MIWA, Makina YABASHI, Masahi ISHII, Megumi AKAI-KASAYA, Shik SHIN, Tetsuya ISHIKAWA, Yuji KUWAHARA and Masakazu AONO Department of Material and Life Science, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-08...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1986
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.35.755